2008.09-2012.06, Wuhan University, Physics Major, Bachelor of Science in Physics

2012.09-2019.01, Institute of Physics, Chinese Academy of Sciences, Condensed Matter Physics Major, Doctor of Science in Physics

2019.01-2024.11, Huairou Extreme Facility Platform, Institute of Physics, Chinese Academy of Sciences, Postdoctoral Researcher

2024.12- Present, Bioimaging Center, Institute of Biophysics, Chinese Academy of Sciences, Engineer

Main Research Directions:

Time-resolved electron microscopy, including ultrafast transmission and ultrafast scanning.

Representative Papers and Patents:

[1] Yang Dong, Li Zhongwen, Tian Yuan, Sun Shuaishuai, Tian Huanfang, Yang Huaixing, Li Jianqi. An electron gun for ultrafast scanning electron microscopy and its electron optical simulation [J/OL]. Acta Physica Sinica, 73(2024) (Corresponding Author)

[2] Z. Li, R.J. Xiao, P. Xu, C. Zhu, S. Sun, D. Zheng, H. Wang, M. Zhang, H. Tian, H.X. Yang, J.Q. Li, Lattice Dynamics and Contraction of Energy Bandgap in Photoexcited Semiconducting Boron Nitride Nanotubes, ACS Nano, 13 (2019) 11623-11631.

[3] Z. Li, Z.A. Li, S. Sun, D. Zheng, H. Wang, H. Tian, H. Yang, X. Bai, J. Li, Direct Observation of Inner-Layer Inward Contractions of Multiwalled Boron Nitride Nanotubes upon in Situ Heating, Nanomaterials (Basel), 8 (2018).

[4] Z. Li, S. Sun, Z.A. Li, M. Zhang, G. Cao, H. Tian, H. Yang, J. Li, Ultrafast structural dynamics of boron nitride nanotubes studied using transmitted electrons, Nanoscale, 9 (2017) 13313-13319.

[5] Li Zhongwen; Tian Yuan; Zhang Yongzhao; Tian Huanfang; Yang Huaixing; Li Jianqi ; A device for introducing laser into the sample chamber of a transmission electron microscope that can shield X-rays and its usage method, 2022-12-13, China, 202111060929.X (Patent)

[6] Li Jianqi; Tian Huanfang; Yang Huaixing; Li Zhongwen; Zhu Chunhui; Zheng Dingguo ; Ultrafast imaging device and its method, 2023-12-12, China, CN202110012238.6 (Patent)

[7] Li Jianqi; Tian Huanfang; Yang Huaixing; Li Zhongwen; Zhu Chunhui; Zheng Dingguo ; A system for ultrafast scanning electron microscopy and its method, 2022-09-05, China, CN202211124608.6 (Patent)